arrow-left-2arrow-left-3arrow-left-4arrow-leftchronodiggdown-arrow--lineardown-arrowearthenvelopefacebookfacebook_ (2)facebook_forward-arrowforwardgooglehomeico-downloadico-linkindustries--1industries--10industries--10_oldindustries--2industries--3industries--4industries--5industries--6industries--6_oldindustries--7industries--8industries--9linkedinmailmarkernewspaperpadlockpage-arrow-leftpage-arrow-rightpage-listpencilpinterestplay-buttonprintersearchsocial-diggsocial-facebooksocial-googlesocial-instagramsocial-linkedinsocial-pinterestsocial-twittersocial-youtubestartelephonetwittertwitter_user

Non-contact measurement within industry 4.0

STIL SYSTEMS

STIL MicroMeasure3D, PORTICO3D and MAESTRO3D are measurement systems designed to achieve true 3D metrology of each point for the most demanding applications adapted to Industry 4.0 standards.

The measurement range of the sensor heads starts at 150 μm and goes up to 30 mm, giving different scales of analysis and allowing a wide range of characterizations.

The unique time measurement mode allows the analysis of dynamic phenomena using the measurement of a single point, line or surface with a predefined time as parameter.

STIL Systems are dedicated tools for non-contact surface measurement, including 3D ISO25178-602 roughness, shape metrology, 3D microtopography and thickness measurement of transparent layers.

MICROMESURE 2 system fully exploits the extraordinary performances of all STIL non-contact sensors in various applications and fields. For advanced measurement and deeper surface analysis, the Mountains® software can be included.

Non contact measure within industry 4.0 stil systems
DESCRIPTION

STIL Systems series is made of different models, each one dedicated to one or several applications, in industrial and laboratory environments, 24/7.

Combined with the wide range of STIL point probe heads, they offer excellent metrological performances, both on and off-line.

Flexible, easy to use and respectful of environmental constraints, STIL systems are standard or customized to meet non-contact measurement and defect control needs in short cycle times: from 4 seconds to measure a car glass or a complete smartphone.

STIL Systems solutions are used in multiple application contexts and on any type of surface reflectivity, whether transparent or opaque, shiny or diffuse.

Related applications

Close
Close

Request information

Insert your first name
Insert your last name
Insert the company name
Insert your email

To help the message delivery directly to the division in charge, please select the application field in the list below:

Insert your message

Before sending the form please read carefully the INFORMATION NOTICE on personal data processing provided in accordance with the Regulation EU 2016/679.

Please accept the privacy policy
Top Contact us