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Film Width Measurement on R2R Process

In the field of electronic devices, Roll-to-Roll (R2R) processing is a method of producing flexible and large-area electronic devices on a roll of plastic film or metal foil.

R2R is a family of manufacturing techniques involving continuous processing of a flexible substrate that is transferred between two moving rolls of material in which additive processes can be used to build film structures in a continuous manner.

R2R is an important class of substrate-based manufacturing processes applied nowadays for EV market lithium-ion battery (LIB) such as:

  • Metal foil (aluminium and copper) manufacturing
  • Plastic film for separator production
  • Printed/Flexible thin-film batteries electrodes (cathode and anode)
Film Width Measurement On R2r Process

The current needs to apply R2R processes in flexible thin-film battery manufacturing are focused on the following process operation:

Rolling process (LIB electrode manufacturing)

  • R2R Coating and Drying
  • R2R Calendering or Compressing
  • R2R Slitting or Cutting

In all these operations is important to reduce excessive scrap rates of electrode manufacturing by means an In-line quality measurement and control as example non-contact technology sensors for width checking.

The width checking must be performed strictly within the production line, therefore be carried out with non-contact technologies. In order to perform in-line measurement of the width on delicate material that can’t be touched and measured with traditional contact solution, MARPOSS/AEROEL proposed its own non-contact technologies that is Laser Scanner Micrometers.

  • Scanning Motor with Fluid Dynamic Bearing Technology (without ball bearing) works perfectly, with no wear.
  • NO-VAR active thermal compensation allows you to automatically compensate room temperature changes.
  • Permanent self calibration and Excellent linearity
  • Fully re-programmable with capability to store different application programs
  • Direct connection to PC, PLC e NC
  • Inputs for reading and synchronizing quadrature encoders







Measuring Field

40 mm

80 mm

150 mm

Measurable Width

0,06 ÷ 38 mm

0,75 ÷ 78 mm

0,8 ÷ 149 mm


(T=1s, ±2σ)

+/- 0,07 µm

+/- 0,2 µm

+/- 0,4 µm

Scanning Frequency

1.500 Hz

Laser Source

VLD (Visible Laser Diode); λ = 650 nm




English AEROEL R2R process on film: (2.79MB)
Japanese AEROEL R2R process on film: (2.65MB)
Korean AEROEL R2R process on film: (2.87MB)

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