Non contact measure with chromatic confocal technology

IRIX™

Irix ™ is a family of non-contact sensors based on chromatic confocal technology capable to measure distances and thicknesses on any material, which is transparent to white light.

Irix ™ is able to measure up to 5 layers of material simultaneously. The controller can be used in combination with a large family of optical probes with different measuring ranges, mechanical dimensions and metrological specifications to best meet the most diverse application needs.

The controller is available in two models: with 7-inch integrated display or in blind version with DIN-guide connection for the cabinet.display or in blind version with DIN-guide connection for the cabinet.

DESCRIPCIÓN
VENTAJAS
ESPECIFICACIONES TÉCNICAS
VERSIONES
APLICACIONES
Vídeo
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DESCRIPCIÓN

The Irix controllers family is made up of different models (1 and 2 synchronized channels) which, in combination with the huge variety of optics (Marposs and Stil), allows to offer excellent metrological performance (up to nanometer).

Built with the highest quality standards, Irix is a robust and reliable product suitable for use in an industrial environment.

The acquisition of Stil within the Marposs group contributes with more than twenty years of experience in this type of technology to provide solutions in multiple application contexts. All Stil confocal probes are compatible with Irix ™.

VENTAJAS

The chromatic confocal technology allows to measure any material capable of reflecting white light (for example: metal, glass, plastic, paint films, liquids).
The non-contact measurement is suitable in all cases where it is necessary to measure without touching the target
Up to five transparent layers can be measured simultaneously with a single optical probe
High measurement accuracy
Interchangeable sensors; Irix can save up to 32 maps to allow the use of the most appropriate probe.
Integrated 7 ”display
Passive optical probe not affected by heat and electrical noise
Availability of SDK and protocol commands for easy integration into any system
Reduced measurement spot
Synchronized measurement with encoder (space synchronism) for dynamic acquisitions
Roughness measurements

ESPECIFICACIONES TÉCNICAS

Optics with tilting angle up to ± 45 ° for profile measurement
Optics with reduced diameters Ø4mm, Ø6mm and Ø8mm for use in equipment with reduced dimensions
7” Integrated display, with easy to use graphical interface for laboratory use
2 synchronized channels for thickness measurement of non-transparent targets in roll to roll applications
Synchronized measurements with encoder for precise profile reconstruction.
3 encoders Inputs (TTL and HTL models)
2 analog outputs (0 ÷ 10V)
Up to 32 calibration maps
Saving data in CSV format

VERSIONES

Irix is available in two versions: one for the electrical cabinet with DIN-guide connection and the other with 7 " integrated display.
Both versions are available with 1 channel or with 2 synchronized channels.

APLICACIONES

The chromatic confocal technology of Irix ™ is suitable for various applications in many application sectors:

Automotive glass
Glass containers and packaging industry
Electronics Industry (PCB)
Semiconductor industry (silicon wafer)
applications for measuring roll-to-roll, transparent and non-transparent films (e.g. EV battery covers)
the CCC industry
Electrical Vehicle Industry (Batteries)
Robotics
Micromechanics
Medical
Aviation
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Vídeo

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BROCHURES AND MANUALS

	Catálogo	Ficha técnica	Flyer
Inglés	STIL - General catalogue: (13.23MB)	-	IRIX-CPS2: (1.79MB) IRIX-CPS1 BLIND: (1.71MB) IRIX-CPS1 DISPLAY: (1.63MB)
Japonés	STIL - General catalogue: (21.22MB)	-	IRIX-CPS1 DISPLAY: (465.80kB) IRIX-CPS2: (499.03kB) IRIX-CPS1 BLIND: (476.19kB)
Chino simplificado	STIL - General catalogue: (18.78MB)	STIL - General catalogue: (18.78MB)	-