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Non contact thickness measurement

STIL chromatic confocal sensors are destinated to measure thicknesses without contact, by transparence or step height difference, in every environment such as in-line industries or in labs. 
The principle consists in measuring the position of a diopter, ie the interface between 2 surfaces with a different refractive index, and simultaneously the position of another diopter. The difference between the 2 distance measurements indicates the optical thickness measurement, from which the mechanical thickness is deduced.
Measuring samples comprising several layers is possible using the same method: The multilayer software measurements is available on some STIL MARPOSS controllers.

Non contact thickness measurement


  • High Axial resolution : From nanometer scale (nm)

  • High Lateral resolution : From micrometer scale (µm)

  • Optical Heads only composed of passive components

  • High signal to noise ratio

  • Works on all types of samples

  • Wide choice of measuring ranges

  • Steep slope compatibility thanks to Maximum Numerical Aperture (NA)

  • Coaxial (no « shadowing »)

  • « Speckle » free


STIL MARPOSS Sensors are composed of several references, from 1 measurement point to multiple measurement points distributed along a line or within a field.
The ChromaPoint Optical Heads are interchangeable to warranty flexibility, reliability and adaptability in any kind of applications and on every surface reflectivity : transparent, opaque, diffusing, shiny.
For transparent sample as glass, the minimum thickness measurement is indicated within datasheet and specification in taking into account the path through a surface with refractive index n=1.5. 
Similarly, the maximum thickness of transparent sample as glass is function of the refractive index.



Inglés STIL - General catalogue: (13.23MB)
Japonés STIL - General catalogue: (21.22MB)
Chino simplificado STIL - General catalogue: (18.78MB)

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