At the heart of SMARTNet is the Smart Connector, not just a connection point, but a miniature brain. It hosts integrated electronics for signal digitization and linearization, giving you fully accurate measurements. A 360° bi-color LED provides instant visual feedback on the sensor’s status, making diagnostics immediate and intuitive. Thanks to the push-pull connector, connecting and disconnecting elements is as simple as a click, no tools, no threads, no delays.
Marposs presents Horizon, an advanced interferometric technology controller designed for high-precision measurement applications in semiconductor, 3C (Computer, Communication, Consumer electronics), and other demanding industrial sectors where nanometric accuracy is essential. Horizon leverages laser interferometry to achieve nanometer-level resolution, ensuring exceptional repeatability and long-term measurement stability. By eliminating mechanical contact, it minimizes drift and wear, making it the ideal solution for wafer inspection and planarity measurement, lithographic mask alignment, and microelectronic component testing.
Marposs has introduced a standardized equipment layout designed to perform leak testing on a wide range of products, including high-volume samples. Initially developed for the marine industry—specifically for testing tanks with capacities ranging from 200 to 800 liters—this solution has since been adapted for similar components used across various sectors. The testing process ensures 100% production control by employing Marposs Tecna leak detectors, which utilize the pressure drop method with air. A key feature of this setup is the integration of an air dryer, which enhances the quality of the fluid used in the process, ultimately contributing to more accurate and reliable test results.
In the semiconductor industry, precision is paramount. The wafer dicing process, a critical step in chip production, demands exceptional accuracy to cut fragile materials like silicon, glass, sapphire, and advanced compounds such as silicon carbide (SiC) and gallium nitride (GaN). Even a minor defect during this phase can lead to significant production losses. Marposs has developed an innovative solution: the Visual Blade Inspector (VBI). This cutting-edge sensor technology redefines how dicing machines operate, ensuring higher precision and reliability.
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